EBSD， The full name is electron backscatter diffraction, which is characterized by retaining the conventional characteristics of scanning electron microscopy while performing sub micron level diffraction with spatial resolution, providing crystallographic data.

Example 1

EBSD results of tungsten carbide/cobalt samples obtained under 20kV conditions

SEM-EBSD testing of solder balls on PCB board

In situ observation of the phase transition from γ to α in low carbon steel

Stress and strain data of in-situ EBSD for Al alloy

Example 2: The coaxial TKD technique was used to test the nano layered structure of nanocrystalline twin copper, and the 2nm scale twin layered structure was resolved

The twin structure PQ diagram and IPFX overlay display of nano twin copper, as well as the angle distribution diagram at the line segment in the figure